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X-ray diffraction application

См. также в других словарях:

  • Ray tracing (physics) — In physics, ray tracing is a method for calculating the path of waves or particles through a system with regions of varying propagation velocity, absorption characteristics, and reflecting surfaces. Under these circumstances, wavefronts may bend …   Wikipedia

  • X-ray crystallography — can locate every atom in a zeolite, an aluminosilicate with many important applications, such as water purification. X ray crystallography is a method of determining the arrangement of atoms within a crystal, in which a beam of X rays strikes a… …   Wikipedia

  • Neutron diffraction — Science with Neutrons Foundations Neutron temperature Flux · Radiation  …   Wikipedia

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  • X-ray — [ 22 December 1895 and presented to Professor Ludwig Zehnder of the Physik Institut, University of Freiburg, on 1 January 1896. The dark oval on the third finger is a shadow produced by her ring. [cite book last = Kevles first =Bettyann Holtzmann …   Wikipedia

  • Dynamical theory of diffraction — The dynamical theory of diffraction describes the interaction of waves with a regular lattice. The wave fields traditionally described are X rays, neutrons or electrons and the regular lattice, atomic crystal structures or nanometer scaled multi… …   Wikipedia

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  • X-ray standing waves — The X ray standing wave technique = The X ray standing wave (XSW) technique can be used to study the structure of surfaces and interfaces with high spatial resolution and chemical selectivity. Pioneered by B.W. Batterman in the 1960s the… …   Wikipedia

  • X-ray photoelectron spectrometry — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq …   Wikipédia en Français

  • X-ray fluorescence — (XRF) is the emission of characteristic secondary (or fluorescent) X rays from a material that has been excited by bombarding with high energy X rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis,… …   Wikipedia

  • Reflection high energy electron diffraction — (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that rely also… …   Wikipedia

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